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Test Engineering
Do you have a load of LSI test technology?
- We have a good answer and offer excellent test technology!
We offer the best solution
We offer the best solution which solves various programs on LSI testing
and contribute to improvement of your profit in a short period.
Testing Solutions
| ·Design Evaluation |
·Failure Analysis |
| ·Reliability Test |
·Starting Mass Production & Correlation |
| ·Test Program Conversion between ATEs |
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| ·Development of Mass Production Test Specification & Test Program |
| ·Development Specifications from Test Program |
Products
| Memory |
SDRAM,DDR,EDO,DRAM,RDRAM,SRAM,PSRAM,NOR-FLASH,NAND-FLASH |
| Logic |
CPU,ASIC,MPU,DSP |
| Analog |
Discrete device, Power driver,Amp,Buffer,Compareter,AD/DA,LCD |
| Opt device |
Sensor,LED,Photo coupler,Laser diode |
| Imager |
CCD,CMOS,Image Sensor |
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ATE
| Memory Tester |
ADVANTEST,YOKOGAWA,Hitachi DECO,Credence |
| Logic Tester |
AGILENT,TERADYNE,ADVANTEST,YOKOGAWA,LTX,IMS,Hitachi DECO |
| Mixed Tester |
AGILENT,TERADYNE,YOKOGAWA |
| Other |
Measurement Units,Generator Units,Analyzer Systems |
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Test Engineering PDF Download
Test Engineering PDF [Acrobat5 Format:423KB]
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